J200 Femto iX Laser Ablation (LA) Instrument
The 200 Femto iX LA Instrument represents the state-of-the-art in ultrafast laser sampling technology based on the world’s most compact bench-top design. This instrument is the next evolution of the highly successful and proven J200 Femto LA Instrument with the largest installed base in the world.
At the heart of the J200 Femto iX is a compact and robust laser source that is exclusively available from Applied Spectra. With cutting-edge hardware designs that include intelligent transport gas control, auto sample height adjustment, high resolution 3D sample stages, innovative sample cells, and LIBS (Laser Induced Breakdown Spectroscopy) add-on capability, the J200 Femto iX is the most innovative femtosecond LA instrument that can tackle the most demanding LA-ICP-MS analysis. The instrument is also accompanied by the industry leading data analysis software, Clarity Femto, for efficient time-resolved ICP-MS signal processing, straightforward quantitative analysis, 2D/3D elemental imaging, and sample forensics.
Highlights of the J200 Femto iX LA Instrument:
- High precision, accuracy, and sensitivity
- Compact bench-top design
- Affordable cost
- Low maintenance cost
- Compact high repetition rate femtosecond laser
- Intelligent transport gas control
- Auto sample height adjustment
- High resolution 3D sample stages
- Innovative sample cells
- LIBS (Laser Induced Breakdown Spectroscopy) add-on capability for Tandem LA-ICP-MS and LIBS analysis
Achieving Ultra-Sensitive Inductively Coupled Plasma – Mass Spectrometry (LA-ICP-MS) Analysis with the J200 LA Instrument: A Glass Sample Study
Applied Spectra Inc.’s J200 LA instrument was interfaced with an ICP-MS to establish figures of merit. NIST glass SRMs (trace elements in glass) were analyzed to determine the absolute mass that can be detected and to determine limits of detection (LODs).