Applied Spectra and Agilent Technologies are pleased to announce a joint technical webinar on LA-ICP-MS and Tandem LA-LIBS
Are you struggling to analyze very thin or small samples? Are you dealing with samples that are difficult to digest? Or are looking to reduce acid cost, waste and analysis time? Or are you looking to understand spatial information of specific elements in your samples? Do you have difficult interferences that are not removed reliably in a conventional ICP-MS? Would you like to be able to quickly classify the major elements of your sample or add additional elements such as C, H, O, N or F?
If the answer is “yes” to any of the questions above, you need to attend this educational webinar on LA-ICP-MS with state of the art “triple quad” or MS-MS ICP-MS technology. When a state-of-the-art LA instrument is paired up with sensitive ICP-MS capable of performing superior interference elimination, amazing possibilities exist for direct solid sample analysis. Register for this webinar and learn:
- State-of-the-art LA technology from Applied Spectra – J200 and RESOlution
- High performance ICP-MS from Agilent Technologies – 7900 & 8900 QQQ ICP-MS
- Benefits of Agilent 8900 QQQ (or MS/MS) ICP-MS
- Benefits of Tandem (LA simultaneous with LIBS)
- “Hands-on” demonstration of real examples running samples by LA-ICP-MS
Webinar Date and Time
November 17th, Tuesday, 10:00 AM PST/ 1:00 PM EST
The applications that are highlighted in the webinar are selected to help you understand how to apply LA-ICP-MS for different measurement objectives – qualitative screening, quantitative analysis, and spatial analysis (mapping) of elements. These application examples include:
- Metal analysis for impurities (including rapid classification by LIBS simultaneous with trace element analyses by LA-ICP-MS)
- Li-ion battery material analysis (Fluorine analysis by LIBS simultaneous with trace elements by LA-ICP-MS)
- Geological sample mapping (F analyses by LIBS simultaneous with trace elements and/or isotopes by LA-ICP-MS)
We look forward to meeting you at our webinar!
Alan Koenig, Director of Global Application at Applied Spectra Inc.
Alan Koenig is the director of global application at Applied Spectra. Alan brings Applied Spectra 20+ years of LA-ICP-MS and instrument method development experience for a wide range of solid sample analysis. He has previously worked at the United States Geological Survey (USGS) where he ran the LA-ICP-MS Facility for 17 years.
He has published in a variety of journals including the Journal of Analytical Atomic Spectroscopy. Geology, American Mineralogist, Geoarchaeology, Economic Geology and numerous others. He has contributed significantly to the design and production of geological reference materials used for LA-ICP-MS and LIBS. Alan is also versed in other analytical techniques such as Raman (including Raman inside the LA system), micro-XRF, LIBS, SEM and electron beam techniques. Alan received his B.S. and M.S. in Geology from Colorado State University.
Dr. Jenny Nelson, Application Scientist at Agilent Technologies
Jenny Nelson received her Ph.D. in Analytical Chemistry from the University of Cincinnati in 2007, and her MBA from Saint Mary’s College of California in 2011. Currently, Jenny is an Application Scientist for the Life Science and Chemical Analysis team at Agilent Technologies, joining in 2012 (with a step away in 2019). Jenny is also an Adjunct Professor in the Department of Viticulture and Enology at the University of California, Davis, since 2013. Jenny has been very active with AOAC and ASTM over the past eight years, serving on expert review panels, chairing committees, and volunteering to develop new methods needed by the industry.
Jenny has extensive experience in operating and method development for Inductively Coupled Plasma Mass Spectroscopy (ICP-MS), Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES), Microwave Plasma Atomic Emission Spectroscopy (MP-AES). Jenny has broad knowledge and experience in different speciation analysis for many sample matrices using GC-ICPMS and LC-ICPMS. As well as vast experience with sp-ICP-MS for many applications.
Craig Jones, Application Scientist at Agilent Technologies
Craig has been with Agilent for over 15 years as an ICP-MS applications scientist. He has been involved with multiple type of applications for ICP-MS, including environmental, pharmaceutical, semiconductor, geologic, and clinical analyses, to name a few. Previous to Agilent He worked in an environmental lab performing analysis and supervising both the inorganic and organic sections of the laboratory. In his spare time, Craig enjoys volunteering at the local marine science center, mountain biking, hiking and relaxing at the beach. Craig obtained a bachelor of science degree in chemistry from Fort Lewis College in Durango, CO.