Free Technical Webinar on Advanced Direct Solid Chemical Analysis Using Femtosecond Laser Pulses

Laser Ablation for Chemical Analysis Using Femtosecond Laser Pulses
Webinar Presented by Dr. Jhanis Gonzalez

Tuesday, February 20, 11:00 am PST

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Jhanis Gonzalez, Ph.D

Jhanis Gonzalez, Ph.D


Laser ablation has advanced over the last 50 years to become a dominant solid sampling technology for numerous chemical analysis applications. While laser ablation has been used commonly together with ICP-MS/OES, detectors that are sensitive and capable of short gating are enabling LA plasma emission based approaches such as LIBS (Laser Induced Breakdown Spectroscopy) and LAMIS (Laser Ablation Molecular Isotopic Spectrometry).

Now exciting instrumentation advances are being made in the laser ablation based chemical analysis using femtosecond laser pulses. Imagine you can use laser pulses that are almost one million times shorter in duration and significantly lower in energy for the best precision and accuracy of LA-ICP-MS and LIBS measurements. And you can do both LA-ICP-MS and LIBS measurement simultaneously to extract the most information about your samples, all with femtosecond laser pulses!

This webinar highlights:

  • Key underlying mechanisms of the ablation process that are critical for accurate and precise analysis using LIBS and LA-ICP-MS with a focus on femtosecond laser ablation.
  • Recent advances in the femtosecond laser technology that led to high laser source reliability and an incredible reduction in instrumentation footprint.
  • Technical benefits of Femto Tandem LA–LIBS instrumentation in which LIBS detectors are integrated into a conventional LA instrument to provide simultaneous or sequential LA-ICP-MS and LIBS analysis.
  • Numerous examples of applications and related analytical methods to provide attendees a better idea on the applicability of the technology for their research and analytical problems.
J200 Femto iX LA Instrument

J200 Femto iX LA Instrument





The following people may benefit from this webinar:

  • Researchers familiar with LA-ICP-MS who are looking to improve existing analytical performance of nanosecond LA-ICP-MS
  • Researchers or lab analysts interested in enhancing depth profiling resolution for thin film analysis
  • Geochemists who are interested in measurement capability for organic and halogen elements during LA-ICP-MS measurement (C, H, O, N, F, etc)
  • Lab managers interested in increasing throughput of the bulk analysis using LA-ICP-MS and LIBS
  • Lab managers with high-end ICP-MS (multi-collector ICP-MS, HR ICP-MS, ICP-QQQ, etc) who are looking for solid sampling capability
  • Anyone interested in analysis of materials difficult to ablate using nanosecond laser technology
  • Anyone interested in femtosecond laser ablation fundamentals
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